IC半导体测试插座用导电Fe-Cu-X系合金的制备研究

{"title":"IC半导体测试插座用导电Fe-Cu-X系合金的制备研究","authors":"In-Ho Kim, Byung-Seo Jeon, Tae-Heng Lee, Chang-Bin Song","doi":"10.4283/jkms.2021.31.6.322","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":42623,"journal":{"name":"Journal of the Korean Magnetics Society","volume":" ","pages":""},"PeriodicalIF":0.2000,"publicationDate":"2021-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Study on the Fabrication of Electric Conductivity Fe-Cu-X System Alloy for IC Semiconductor Test Socket\",\"authors\":\"In-Ho Kim, Byung-Seo Jeon, Tae-Heng Lee, Chang-Bin Song\",\"doi\":\"10.4283/jkms.2021.31.6.322\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":42623,\"journal\":{\"name\":\"Journal of the Korean Magnetics Society\",\"volume\":\" \",\"pages\":\"\"},\"PeriodicalIF\":0.2000,\"publicationDate\":\"2021-12-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of the Korean Magnetics Society\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.4283/jkms.2021.31.6.322\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"PHYSICS, APPLIED\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of the Korean Magnetics Society","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.4283/jkms.2021.31.6.322","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, APPLIED","Score":null,"Total":0}