Study the Effect of Wavelengths and Energies of Laser on Zinc Telluride Thin Films Formed with Laser Technique

In this work, a pulsed laser deposition technique was used which is one of the modern methods of preparing thin films where zinc telluride was deposited on slices of glass using different Nd: YAG laser wavelengths (0.532 µm and 1.064 µm) .Two different laser energies (600 mJ and 900 mJ) were used to study its effects on the properties of Zinc Telluride films at room temperature. Measurement of X-Ray Diffraction (XRD) and Atomic Force Microscope (AFM) was used to demonstrate the structural and morphological properties of the prepared Zinc Telluride thin films which shows that the films consists of multiple crystals and its structural design is a cubic with a small crystallites size and dissimilar shapes . The optical properties in the range of (400-1000) nm using UV-VIS spectrophotometer were studied by transmission and reflection spectra where found that for Zinc Telluride films have more transmission in the range of visible spectrum which can be reach to greater than 90 % with wide band gap of 2.2 eV is a promising material to be used in photovoltaic devices as solar cells and detectors.