{"title":"第五章:知识塔视角下的成分识别与解释","authors":"Mai Xu, J. Ren, Zulin Wang","doi":"10.1016/BS.AIEP.2017.01.005","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":50863,"journal":{"name":"Advances in Imaging and Electron Physics","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2017-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/BS.AIEP.2017.01.005","citationCount":"0","resultStr":"{\"title\":\"Chapter Five – Component Identification and Interpretation: A Perspective on Tower of Knowledge\",\"authors\":\"Mai Xu, J. Ren, Zulin Wang\",\"doi\":\"10.1016/BS.AIEP.2017.01.005\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":50863,\"journal\":{\"name\":\"Advances in Imaging and Electron Physics\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-12-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1016/BS.AIEP.2017.01.005\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Advances in Imaging and Electron Physics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1016/BS.AIEP.2017.01.005\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"Physics and Astronomy\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advances in Imaging and Electron Physics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1016/BS.AIEP.2017.01.005","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"Physics and Astronomy","Score":null,"Total":0}
期刊介绍:
Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.