精密电子元件量产过程中的不良率预测和故障原因诊断

IF 3 Q2 CHEMISTRY, ANALYTICAL Analytical science advances Pub Date : 2023-05-07 DOI:10.1002/ansa.202300019
Hiromasa Kaneko
{"title":"精密电子元件量产过程中的不良率预测和故障原因诊断","authors":"Hiromasa Kaneko","doi":"10.1002/ansa.202300019","DOIUrl":null,"url":null,"abstract":"<p>Many defects occur during the mass production of precision electrical components. To control and manage them, process variables (PVs), such as the temperature, pressure, flow rate, and liquid level, are measured and time-series data analyzed. However, identification of point of defects is difficult as any operation can cause defects and multiple equipment units are used in parallel for some operations. This study considers the combination of unfavourable conditions between operations to predict the defect rate (DR) of products. A dataset measured in an actual mass-production process for precision electrical components is analysed to predict the DR of the products. Data analysis is performed on a dataset generated from an actual mass-production process for precision electrical components, and machine learning models. are constructed using ensemble learning methods, such as random forests, the gradient boosting decision tree, XGBoost, and LightGBM. Conventional univariate analyses only show a maximum correlation coefficient of 0.17 with a DR and process variables (PVs). In this study, we improved the correlation coefficient to 0.73 using a multivariate analysis, including the data of PVs that are not considered important in the process, and appropriately transformed PVs based on the domain knowledge of the process. Furthermore, PVs that were closely related to the DR could be diagnosed based on the feature importance of the constructed machine-learning models. This study confirms the importance of using domain knowledge to improve the prediction ability of machine learning models and the interpretation of constructed models.</p>","PeriodicalId":93411,"journal":{"name":"Analytical science advances","volume":null,"pages":null},"PeriodicalIF":3.0000,"publicationDate":"2023-05-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1002/ansa.202300019","citationCount":"0","resultStr":"{\"title\":\"Defect rate prediction and failure-cause diagnosis in a mass-production process for precision electric components\",\"authors\":\"Hiromasa Kaneko\",\"doi\":\"10.1002/ansa.202300019\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>Many defects occur during the mass production of precision electrical components. To control and manage them, process variables (PVs), such as the temperature, pressure, flow rate, and liquid level, are measured and time-series data analyzed. However, identification of point of defects is difficult as any operation can cause defects and multiple equipment units are used in parallel for some operations. This study considers the combination of unfavourable conditions between operations to predict the defect rate (DR) of products. A dataset measured in an actual mass-production process for precision electrical components is analysed to predict the DR of the products. Data analysis is performed on a dataset generated from an actual mass-production process for precision electrical components, and machine learning models. are constructed using ensemble learning methods, such as random forests, the gradient boosting decision tree, XGBoost, and LightGBM. Conventional univariate analyses only show a maximum correlation coefficient of 0.17 with a DR and process variables (PVs). In this study, we improved the correlation coefficient to 0.73 using a multivariate analysis, including the data of PVs that are not considered important in the process, and appropriately transformed PVs based on the domain knowledge of the process. Furthermore, PVs that were closely related to the DR could be diagnosed based on the feature importance of the constructed machine-learning models. This study confirms the importance of using domain knowledge to improve the prediction ability of machine learning models and the interpretation of constructed models.</p>\",\"PeriodicalId\":93411,\"journal\":{\"name\":\"Analytical science advances\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":3.0000,\"publicationDate\":\"2023-05-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://onlinelibrary.wiley.com/doi/epdf/10.1002/ansa.202300019\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Analytical science advances\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://onlinelibrary.wiley.com/doi/10.1002/ansa.202300019\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"CHEMISTRY, ANALYTICAL\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Analytical science advances","FirstCategoryId":"1085","ListUrlMain":"https://onlinelibrary.wiley.com/doi/10.1002/ansa.202300019","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"CHEMISTRY, ANALYTICAL","Score":null,"Total":0}
引用次数: 0

摘要

在精密电气元件的批量生产过程中,会出现许多缺陷。为了控制和管理它们,需要测量过程变量(pv),如温度、压力、流量和液位,并分析时间序列数据。然而,缺陷点的识别是困难的,因为任何操作都可能导致缺陷,并且在某些操作中并行使用多个设备单元。本研究考虑了操作之间不利条件的组合,以预测产品的缺陷率(DR)。分析了精密电子元件实际量产过程中测量的数据集,以预测产品的DR。数据分析是对精确电子元件的实际批量生产过程和机器学习模型生成的数据集进行的。使用集成学习方法构建,如随机森林、梯度增强决策树、XGBoost和LightGBM。传统的单变量分析仅显示DR和过程变量(pv)的最大相关系数为0.17。在本研究中,我们通过多变量分析将相关系数提高到0.73,包括过程中不重要的pv数据,并根据过程的领域知识对pv进行适当的转换。此外,可以根据构建的机器学习模型的特征重要性来诊断与DR密切相关的pv。本研究证实了使用领域知识来提高机器学习模型的预测能力和对构建模型的解释的重要性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

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Defect rate prediction and failure-cause diagnosis in a mass-production process for precision electric components

Many defects occur during the mass production of precision electrical components. To control and manage them, process variables (PVs), such as the temperature, pressure, flow rate, and liquid level, are measured and time-series data analyzed. However, identification of point of defects is difficult as any operation can cause defects and multiple equipment units are used in parallel for some operations. This study considers the combination of unfavourable conditions between operations to predict the defect rate (DR) of products. A dataset measured in an actual mass-production process for precision electrical components is analysed to predict the DR of the products. Data analysis is performed on a dataset generated from an actual mass-production process for precision electrical components, and machine learning models. are constructed using ensemble learning methods, such as random forests, the gradient boosting decision tree, XGBoost, and LightGBM. Conventional univariate analyses only show a maximum correlation coefficient of 0.17 with a DR and process variables (PVs). In this study, we improved the correlation coefficient to 0.73 using a multivariate analysis, including the data of PVs that are not considered important in the process, and appropriately transformed PVs based on the domain knowledge of the process. Furthermore, PVs that were closely related to the DR could be diagnosed based on the feature importance of the constructed machine-learning models. This study confirms the importance of using domain knowledge to improve the prediction ability of machine learning models and the interpretation of constructed models.

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