Ende Wang, Zhiyuan Liu, Bing-zhen Wang, Zhiyu Cao, Shiwei Zhang
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Infrared image stripe noise removal using wavelet analysis and parameter estimation
Infrared image systems often generate stripe noise because of the non-uniformity of the focal plane array, which significantly reduces the visual quality of the image. To solve this problem, we proposed an effective single-frame denoising method in this paper. First, the wavelet function extracts the approximate and vertical components of the original image containing stripe noise. Then, the approximation component is denoised by parameter estimation, and the vertical component is denoised by guided filtering. Finally, wavelet reconstruction is performed to realize the denoising process of the original image. This method avoids the loss of details of other components of the image and achieves an excellent denoising effect. The experimental results on the public datasets indicate that our proposed method can effectively eliminate the stripe noise of infrared images compared with some advanced methods.
期刊介绍:
The journal (under its former title Optica Acta) was founded in 1953 - some years before the advent of the laser - as an international journal of optics. Since then optical research has changed greatly; fresh areas of inquiry have been explored, different techniques have been employed and the range of application has greatly increased. The journal has continued to reflect these advances as part of its steadily widening scope.
Journal of Modern Optics aims to publish original and timely contributions to optical knowledge from educational institutions, government establishments and industrial R&D groups world-wide. The whole field of classical and quantum optics is covered. Papers may deal with the applications of fundamentals of modern optics, considering both experimental and theoretical aspects of contemporary research. In addition to regular papers, there are topical and tutorial reviews, and special issues on highlighted areas.
All manuscript submissions are subject to initial appraisal by the Editor, and, if found suitable for further consideration, to peer review by independent, anonymous expert referees.
General topics covered include:
• Optical and photonic materials (inc. metamaterials)
• Plasmonics and nanophotonics
• Quantum optics (inc. quantum information)
• Optical instrumentation and technology (inc. detectors, metrology, sensors, lasers)
• Coherence, propagation, polarization and manipulation (classical optics)
• Scattering and holography (diffractive optics)
• Optical fibres and optical communications (inc. integrated optics, amplifiers)
• Vision science and applications
• Medical and biomedical optics
• Nonlinear and ultrafast optics (inc. harmonic generation, multiphoton spectroscopy)
• Imaging and Image processing