基于afm的细胞形貌成像条件优化

Ya Li, Alamusi, S. Dong, Jinghe Wang, Haidong Liu
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引用次数: 0

摘要

癌细胞的表面形貌特别重要,因为细胞在与邻近细胞和细胞外基质相互作用时经常改变其形状。原子力显微镜(AFM)在细胞表面扫描方面具有显著的优势,但扫描效果主要取决于实验条件或经验。本研究采用二次回归正交旋转组合设计,获得AFM细胞谱分析的最佳参数。通过迭代计算,在设定点为0.61 V、扫描速率为2.23 Hz、比例增益为3.85时,可实现对电池的最佳AFM扫描。在此计算的扫描条件下,获得了令人满意的人支气管上皮BEAS-2B和肺腺癌细胞A549的表面形态学图像,可以看到表面粗颗粒和细胞连接结构的细节。这种对细胞谱的新见解可能有助于理解细胞迁移过程中细胞内部重建的潜在机制。
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AFM-based imaging conditions optimisation of cell topography
Surface topography of cancer cell is particularly vital since cell frequently changes its shape as interacting with neighbouring cells and extracellular matrix. Atomic force microscope (AFM) has an extraordinary superiority in surface scanning of cells but the scanning consequence depends upon experiment conditions or experience primarily. In our study, a quadratic regression orthogonal rotation combination design was operated to acquire optimal parameters for cell profiling via AFM. By iterative calculation, the optimum AFM scanning of cell can be accomplished at setpoint of 0.61 V, scanning rate of 2.23 Hz and proportional gain of 3.85. Satisfactory surface morphology images of human bronchial epithelium BEAS-2B and pulmonary adenocarcinoma cell A549 were acquired at this calculated scanning condition, in which the details of surface coarse particle and cell junction structure are visible. This emerging insight into cell profiling may encourage the understanding of the underlying mechanism for cellular inner reconstruction during cell migration.
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来源期刊
International Journal of Nanomanufacturing
International Journal of Nanomanufacturing Engineering-Industrial and Manufacturing Engineering
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