IF 1.8 3区 材料科学Q2 MATERIALS SCIENCE, CHARACTERIZATION & TESTINGStrainPub Date : 2022-05-29DOI:10.1111/str.12416
J. Neggers, E. Héripré, M. Bonnet, S. Hallais, S. Roux
{"title":"一种基于多探测器背散射电子图像的通用地形重建方法","authors":"J. Neggers, E. Héripré, M. Bonnet, S. Hallais, S. Roux","doi":"10.1111/str.12416","DOIUrl":null,"url":null,"abstract":"Surface topographies can be reconstructed from backscattered electron (BSE) images captured from different detector orientations. This article presents a very general approach to this problem, in the spirit of photometric stereo methods, allowing for arbitrary BSE detector number (at least 3) and shapes. The general idea is to both determine the (non‐linear) model parameters and compute the surface topography so that the modelled images match at best the acquired ones. Three samples are used for validation of the measured topography with respect to atomic force microscopy (AFM) measurements. Root mean square (RMS) errors in the range of 10–35 nm, or 1–1.5% of total sampleheight, are obtained.","PeriodicalId":51176,"journal":{"name":"Strain","volume":" ","pages":""},"PeriodicalIF":1.8000,"publicationDate":"2022-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A generic topography reconstruction method based on multi‐detector backscattered electron images\",\"authors\":\"J. Neggers, E. Héripré, M. Bonnet, S. Hallais, S. Roux\",\"doi\":\"10.1111/str.12416\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Surface topographies can be reconstructed from backscattered electron (BSE) images captured from different detector orientations. This article presents a very general approach to this problem, in the spirit of photometric stereo methods, allowing for arbitrary BSE detector number (at least 3) and shapes. The general idea is to both determine the (non‐linear) model parameters and compute the surface topography so that the modelled images match at best the acquired ones. Three samples are used for validation of the measured topography with respect to atomic force microscopy (AFM) measurements. Root mean square (RMS) errors in the range of 10–35 nm, or 1–1.5% of total sampleheight, are obtained.\",\"PeriodicalId\":51176,\"journal\":{\"name\":\"Strain\",\"volume\":\" \",\"pages\":\"\"},\"PeriodicalIF\":1.8000,\"publicationDate\":\"2022-05-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Strain\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://doi.org/10.1111/str.12416\",\"RegionNum\":3,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"MATERIALS SCIENCE, CHARACTERIZATION & TESTING\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Strain","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1111/str.12416","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"MATERIALS SCIENCE, CHARACTERIZATION & TESTING","Score":null,"Total":0}
A generic topography reconstruction method based on multi‐detector backscattered electron images
Surface topographies can be reconstructed from backscattered electron (BSE) images captured from different detector orientations. This article presents a very general approach to this problem, in the spirit of photometric stereo methods, allowing for arbitrary BSE detector number (at least 3) and shapes. The general idea is to both determine the (non‐linear) model parameters and compute the surface topography so that the modelled images match at best the acquired ones. Three samples are used for validation of the measured topography with respect to atomic force microscopy (AFM) measurements. Root mean square (RMS) errors in the range of 10–35 nm, or 1–1.5% of total sampleheight, are obtained.
期刊介绍:
Strain is an international journal that contains contributions from leading-edge research on the measurement of the mechanical behaviour of structures and systems. Strain only accepts contributions with sufficient novelty in the design, implementation, and/or validation of experimental methodologies to characterize materials, structures, and systems; i.e. contributions that are limited to the application of established methodologies are outside of the scope of the journal. The journal includes papers from all engineering disciplines that deal with material behaviour and degradation under load, structural design and measurement techniques. Although the thrust of the journal is experimental, numerical simulations and validation are included in the coverage.
Strain welcomes papers that deal with novel work in the following areas:
experimental techniques
non-destructive evaluation techniques
numerical analysis, simulation and validation
residual stress measurement techniques
design of composite structures and components
impact behaviour of materials and structures
signal and image processing
transducer and sensor design
structural health monitoring
biomechanics
extreme environment
micro- and nano-scale testing method.