{"title":"稀疏状态下持久图的收敛性","authors":"Takashi Owada","doi":"10.1214/22-aap1800","DOIUrl":null,"url":null,"abstract":"The objective of this paper is to examine the asymptotic behavior of persistence diagrams associated with Čech filtration. A persistence diagram is a graphical descriptor of a topological and algebraic structure of geometric objects. We consider Čech filtration over a scaled random sample r−1 n Xn = {r−1 n X1, . . . , r−1 n Xn}, such that rn → 0 as n → ∞. We treat persistence diagrams as a point process and establish their limit theorems in the sparse regime: nr n → 0, n → ∞. In this setting, we show that the asymptotics of the kth persistence diagram depends on the limit value of the sequence nr d(k+1) n . If n r d(k+1) n → ∞, the scaled persistence diagram converges to a deterministic Radon measure almost surely in the vague metric. If rn decays faster so that nr d(k+1) n → c ∈ (0,∞), the persistence diagram weakly converges to a limiting point process without normalization. Finally, if nr d(k+1) n → 0, the sequence of probability distributions of a persistence diagram should be normalized, and the resulting convergence will be treated in terms of the M0-topology.","PeriodicalId":1,"journal":{"name":"Accounts of Chemical Research","volume":null,"pages":null},"PeriodicalIF":16.4000,"publicationDate":"2021-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Convergence of persistence diagram in the sparse regime\",\"authors\":\"Takashi Owada\",\"doi\":\"10.1214/22-aap1800\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The objective of this paper is to examine the asymptotic behavior of persistence diagrams associated with Čech filtration. A persistence diagram is a graphical descriptor of a topological and algebraic structure of geometric objects. We consider Čech filtration over a scaled random sample r−1 n Xn = {r−1 n X1, . . . , r−1 n Xn}, such that rn → 0 as n → ∞. We treat persistence diagrams as a point process and establish their limit theorems in the sparse regime: nr n → 0, n → ∞. In this setting, we show that the asymptotics of the kth persistence diagram depends on the limit value of the sequence nr d(k+1) n . If n r d(k+1) n → ∞, the scaled persistence diagram converges to a deterministic Radon measure almost surely in the vague metric. If rn decays faster so that nr d(k+1) n → c ∈ (0,∞), the persistence diagram weakly converges to a limiting point process without normalization. Finally, if nr d(k+1) n → 0, the sequence of probability distributions of a persistence diagram should be normalized, and the resulting convergence will be treated in terms of the M0-topology.\",\"PeriodicalId\":1,\"journal\":{\"name\":\"Accounts of Chemical Research\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":16.4000,\"publicationDate\":\"2021-03-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Accounts of Chemical Research\",\"FirstCategoryId\":\"100\",\"ListUrlMain\":\"https://doi.org/10.1214/22-aap1800\",\"RegionNum\":1,\"RegionCategory\":\"化学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"CHEMISTRY, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Accounts of Chemical Research","FirstCategoryId":"100","ListUrlMain":"https://doi.org/10.1214/22-aap1800","RegionNum":1,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"CHEMISTRY, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 7
摘要
本文的目的是研究与Čech过滤相关的持续图的渐近行为。持久性图是几何对象的拓扑和代数结构的图形描述符。我们考虑Čech过滤在一个缩放的随机样本r−1 n Xn = {r−1 n X1,…, r−1 n Xn},使得rn→0 = n→∞。我们将持久性图视为一个点过程,并建立了其在稀疏域的极限定理:nr n→0,n→∞。在这种情况下,我们证明了第k个持续图的渐近性取决于序列nr d(k+1) n的极限值。当n r d(k+1) n→∞时,尺度持续图在模糊度量中几乎肯定收敛于确定性Radon测度。如果rn衰减较快,使得nr d(k+1) n→c∈(0,∞),则持久性图弱收敛到一个不归一化的极限点过程。最后,如果nr d(k+1) n→0,则持久性图的概率分布序列应归一化,并根据m0拓扑处理由此产生的收敛性。
Convergence of persistence diagram in the sparse regime
The objective of this paper is to examine the asymptotic behavior of persistence diagrams associated with Čech filtration. A persistence diagram is a graphical descriptor of a topological and algebraic structure of geometric objects. We consider Čech filtration over a scaled random sample r−1 n Xn = {r−1 n X1, . . . , r−1 n Xn}, such that rn → 0 as n → ∞. We treat persistence diagrams as a point process and establish their limit theorems in the sparse regime: nr n → 0, n → ∞. In this setting, we show that the asymptotics of the kth persistence diagram depends on the limit value of the sequence nr d(k+1) n . If n r d(k+1) n → ∞, the scaled persistence diagram converges to a deterministic Radon measure almost surely in the vague metric. If rn decays faster so that nr d(k+1) n → c ∈ (0,∞), the persistence diagram weakly converges to a limiting point process without normalization. Finally, if nr d(k+1) n → 0, the sequence of probability distributions of a persistence diagram should be normalized, and the resulting convergence will be treated in terms of the M0-topology.
期刊介绍:
Accounts of Chemical Research presents short, concise and critical articles offering easy-to-read overviews of basic research and applications in all areas of chemistry and biochemistry. These short reviews focus on research from the author’s own laboratory and are designed to teach the reader about a research project. In addition, Accounts of Chemical Research publishes commentaries that give an informed opinion on a current research problem. Special Issues online are devoted to a single topic of unusual activity and significance.
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