一种无监督的一类分类器支持向量机同时监测多变量质量特征的位置和规模

Arijit Maji, I. Mukherjee
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引用次数: 0

摘要

目的本研究的目的是提出一种有效的基于无监督一类分类器(OCC)支持向量机(SVM)的单变量控制图(OCC-SVM),以同时监测制造过程的“位置”和“规模”变化。设计/方法论/方法基于模拟和两个真实案例,展示了开发、实施和微调OCC-SVM图表内在参数的分步方法。发现一项比较研究,考虑到不同的已知和未知响应分布,表明OCC-SVM在通过个体观察检测样本的过程变化方面非常有效。OCC-SVM图表还显示了具有合理观测子群的样本的有希望的结果。此外,结果还表明,OCC-SVM的性能不受小参考样本量的影响。研究局限性/含义样本响应被认为是同分布的,样本观察之间没有显著的多元自相关。实际意义所提出的易于实现的图表在检测具有已知或未知响应分布的失控信号方面表现出令人满意的性能。独创性/价值建议使用各种多变量(如参数或非参数)控制图来监测制造过程中多个相关响应的平均值(如位置)和方差(如规模)。然而,由于其限制性响应分布假设,参数控制图的实际实施可能很复杂。公开文献中没有证据表明无监督OCC-SVM图表适用于同时监测多变量反应的“位置”和“规模”变化。因此,提出了一种新的高效OCC-SVM单图方法来解决这一差距,以监测具有未知响应分布的多变量制造过程。
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An unsupervised one-class-classifier support vector machine to simultaneously monitor location and scale of multivariate quality characteristics
PurposeThe purpose of this study is to propose an effective unsupervised one-class-classifier (OCC) support vector machine (SVM)-based single multivariate control chart (OCC-SVM) to simultaneously monitor “location” and “scale” shifts of a manufacturing process.Design/methodology/approachThe step-by-step approach to developing, implementing and fine-tuning the intrinsic parameters of the OCC-SVM chart is demonstrated based on simulation and two real-life case examples.FindingsA comparative study, considering varied known and unknown response distributions, indicates that the OCC-SVM is highly effective in detecting process shifts of samples with individual observations. OCC-SVM chart also shows promising results for samples with a rational subgroup of observations. In addition, the results also indicate that the performance of OCC-SVM is unaffected by the small reference sample size.Research limitations/implicationsThe sample responses are considered identically distributed with no significant multivariate autocorrelation between sample observations.Practical implicationsThe proposed easy-to-implement chart shows satisfactory performance to detect an out-of-control signal with known or unknown response distributions.Originality/valueVarious multivariate (e.g. parametric or nonparametric) control chart(s) are recommended to monitor the mean (e.g. location) and variance (e.g. scale) of multiple correlated responses in a manufacturing process. However, real-life implementation of a parametric control chart may be complex due to its restrictive response distribution assumptions. There is no evidence of work in the open literature that demonstrates the suitability of an unsupervised OCC-SVM chart to simultaneously monitor “location” and “scale” shifts of multivariate responses. Thus, a new efficient OCC-SVM single chart approach is proposed to address this gap to monitor a multivariate manufacturing process with unknown response distributions.
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来源期刊
CiteScore
5.60
自引率
12.00%
发文量
53
期刊介绍: In today''s competitive business and industrial environment, it is essential to have an academic journal offering the most current theoretical knowledge on quality and reliability to ensure that top management is fully conversant with new thinking, techniques and developments in the field. The International Journal of Quality & Reliability Management (IJQRM) deals with all aspects of business improvements and with all aspects of manufacturing and services, from the training of (senior) managers, to innovations in organising and processing to raise standards of product and service quality. It is this unique blend of theoretical knowledge and managerial relevance that makes IJQRM a valuable resource for managers striving for higher standards.Coverage includes: -Reliability, availability & maintenance -Gauging, calibration & measurement -Life cycle costing & sustainability -Reliability Management of Systems -Service Quality -Green Marketing -Product liability -Product testing techniques & systems -Quality function deployment -Reliability & quality education & training -Productivity improvement -Performance improvement -(Regulatory) standards for quality & Quality Awards -Statistical process control -System modelling -Teamwork -Quality data & datamining
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