Design of multiple-deferred state sampling plans for exponentiated half logistic distribution

Abstract This paper aims to develop a multiple deferred state sampling plan for a time-truncated life test if the lifetime of the item follows exponentiated half logistic distribution. The optimal parameters of the proposed plan, such as the number of successive lots required for making the decision whether to accept or reject the current lot, sample size, the rejection and acceptance numbers are obtained using two points approach. The implementation of the proposed plan is illustrated with examples. Tables are constructed for various combinations of consumer’s and producer’s risks. Comparison is also made with existing sampling plans under exponentiated half logistic distribution.