近方截面窄MEMS光束上的电荷分布

Communications in Numerical Methods in Engineering Pub Date : 2007-06-25 DOI:10.1002/CNM.1021

Hui Chen, S. Mukherjee

{"title":"近方截面窄MEMS光束上的电荷分布","authors":"Hui Chen, S. Mukherjee","doi":"10.1002/CNM.1021","DOIUrl":null,"url":null,"abstract":"The subject of this paper is the calculation of charge distribution on the surfaces of thin conducting microelectromechanical systems beams, of nearly square cross-section, in electrostatic problems, by the boundary element method (BEM). A line model of a beam is proposed here. This model overcomes the problem of dealing with nearly singular matrices that occur when the standard BEM is applied to very thin features (objects or gaps). This new approach is also very efficient. Numerical results are presented for selected examples. Copyright © 2007 John Wiley & Sons, Ltd.","PeriodicalId":51245,"journal":{"name":"Communications in Numerical Methods in Engineering","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2007-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1002/CNM.1021","citationCount":"4","resultStr":"{\"title\":\"Charge distribution on narrow MEMS beams of nearly square cross-section\",\"authors\":\"Hui Chen, S. Mukherjee\",\"doi\":\"10.1002/CNM.1021\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The subject of this paper is the calculation of charge distribution on the surfaces of thin conducting microelectromechanical systems beams, of nearly square cross-section, in electrostatic problems, by the boundary element method (BEM). A line model of a beam is proposed here. This model overcomes the problem of dealing with nearly singular matrices that occur when the standard BEM is applied to very thin features (objects or gaps). This new approach is also very efficient. Numerical results are presented for selected examples. Copyright © 2007 John Wiley & Sons, Ltd.\",\"PeriodicalId\":51245,\"journal\":{\"name\":\"Communications in Numerical Methods in Engineering\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-06-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1002/CNM.1021\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Communications in Numerical Methods in Engineering\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1002/CNM.1021\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Communications in Numerical Methods in Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1002/CNM.1021","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 4

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Charge distribution on narrow MEMS beams of nearly square cross-section

The subject of this paper is the calculation of charge distribution on the surfaces of thin conducting microelectromechanical systems beams, of nearly square cross-section, in electrostatic problems, by the boundary element method (BEM). A line model of a beam is proposed here. This model overcomes the problem of dealing with nearly singular matrices that occur when the standard BEM is applied to very thin features (objects or gaps). This new approach is also very efficient. Numerical results are presented for selected examples. Copyright © 2007 John Wiley & Sons, Ltd.

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Communications in Numerical Methods in Engineering

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