扫描透射电子显微镜成像成像几何相位分析性能研究

{"title":"扫描透射电子显微镜成像成像几何相位分析性能研究","authors":"A. Pofelski","doi":"10.1016/bs.aiep.2021.07.004","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":50863,"journal":{"name":"Advances in Imaging and Electron Physics","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Performance of Scanning Transmission Electron Microscopy Moiré Sampling Geometrical Phase Analysis\",\"authors\":\"A. Pofelski\",\"doi\":\"10.1016/bs.aiep.2021.07.004\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":50863,\"journal\":{\"name\":\"Advances in Imaging and Electron Physics\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Advances in Imaging and Electron Physics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1016/bs.aiep.2021.07.004\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"Physics and Astronomy\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advances in Imaging and Electron Physics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1016/bs.aiep.2021.07.004","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"Physics and Astronomy","Score":null,"Total":0}