应用故障注入分析间歇故障对微处理器的影响

IEEE Design & Test of Computers Pub Date : 2012-12-01 DOI:10.1109/MDT.2011.2179514

D. Gil, J. Gracia, J. Baraza-Calvo, L. J. Saiz, P. Gil

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引用次数: 16

摘要

间歇性故障是深亚微米集成电路的一个严重问题，在文献中没有得到很好的研究。本文通过故障注入仿真来分析间歇性故障的影响，这是开发此类威胁缓解技术的重要一步。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Analyzing the Impact of Intermittent Faults on Microprocessors Applying Fault Injection

Intermittent faults, being serious concerns for deep-submicron integrated circuits, are not well studied in the literature. This paper performs fault injection simulation to analyze the impact of intermittent faults, which is an important step towards the development of mitigation techniques for such threats.

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