{"title":"基于sat的高故障效率ATPG流","authors":"Stephan Eggersglüß, R. Drechsler","doi":"10.1109/MDT.2012.2205479","DOIUrl":null,"url":null,"abstract":"ATPG based on Boolean Satisfiability (SAT) could be a promising alternative to structural test generation algorithms. This article proposes a SAT-based ATPG flow for generating high quality test patterns while applicable to large industry designs.","PeriodicalId":50392,"journal":{"name":"IEEE Design & Test of Computers","volume":"29 1","pages":"63-70"},"PeriodicalIF":0.0000,"publicationDate":"2012-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/MDT.2012.2205479","citationCount":"18","resultStr":"{\"title\":\"A Highly Fault-Efficient SAT-Based ATPG Flow\",\"authors\":\"Stephan Eggersglüß, R. Drechsler\",\"doi\":\"10.1109/MDT.2012.2205479\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"ATPG based on Boolean Satisfiability (SAT) could be a promising alternative to structural test generation algorithms. This article proposes a SAT-based ATPG flow for generating high quality test patterns while applicable to large industry designs.\",\"PeriodicalId\":50392,\"journal\":{\"name\":\"IEEE Design & Test of Computers\",\"volume\":\"29 1\",\"pages\":\"63-70\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1109/MDT.2012.2205479\",\"citationCount\":\"18\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Design & Test of Computers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MDT.2012.2205479\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Design & Test of Computers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MDT.2012.2205479","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
ATPG based on Boolean Satisfiability (SAT) could be a promising alternative to structural test generation algorithms. This article proposes a SAT-based ATPG flow for generating high quality test patterns while applicable to large industry designs.
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