Min Chen, V. Reddy, S. Krishnan, V. Srinivasan, Yu Cao
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Asymmetric Aging and Workload Sensitive Bias Temperature Instability Sensors
Asymmetric aging under different workload profiles requires on-chip aging sensors to be sensitive to signal edge degradation. The authors in this paper present a 45-nm on-chip aging sensor that directly monitors circuit performance degradation during dynamic operation.
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