{"title":"纳米级CMOS工艺与可靠性传感器","authors":"J. Keane, C. Kim, Qunzeng Liu, S. Sapatnekar","doi":"10.1109/MDT.2012.2211561","DOIUrl":null,"url":null,"abstract":"This paper describes the use of sensing schemes that drive on-chip process and aging variation measurements in manufactured silicon.","PeriodicalId":50392,"journal":{"name":"IEEE Design & Test of Computers","volume":"29 1","pages":"8-17"},"PeriodicalIF":0.0000,"publicationDate":"2012-08-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/MDT.2012.2211561","citationCount":"3","resultStr":"{\"title\":\"Process and Reliability Sensors for Nanoscale CMOS\",\"authors\":\"J. Keane, C. Kim, Qunzeng Liu, S. Sapatnekar\",\"doi\":\"10.1109/MDT.2012.2211561\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes the use of sensing schemes that drive on-chip process and aging variation measurements in manufactured silicon.\",\"PeriodicalId\":50392,\"journal\":{\"name\":\"IEEE Design & Test of Computers\",\"volume\":\"29 1\",\"pages\":\"8-17\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-08-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1109/MDT.2012.2211561\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Design & Test of Computers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MDT.2012.2211561\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Design & Test of Computers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MDT.2012.2211561","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
