直接电弧原子发射光谱法分析氧化镥

Q4 Chemistry Analitika i Kontrol Pub Date : 2021-01-01 DOI:10.15826/analitika.2021.25.2.008
E. Koshel, A. Arkhipenko, V. B. Baranovskaya
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引用次数: 0

摘要

正硅酸镥晶体对初始氧化物的组成要求相当严格:基本物质Lu2O3的含量为99.999wt %。关键是着色杂质:Fe、Ni、Cr、Co、Cu、V、Mn的含量不得超过0.0005 ~ 0.0010 wt%, Pr、Nd、Sm、Er、Tb、Yb的含量不得超过0.0005 wt%。还需要控制Al、As、Bi、Cd、Mg、Mo、Pb、Sb、Si、Sn、Ti、Zn、Y、La、Ce、Sc、Eu、Gd、Dy、Ho、Tm的含量。为了确定氧化镥的杂质组成,直接电弧原子发射光谱(DC - arc)是一种很有前途的分析方法。该方法的优点是测定化学成分时不需要样品溶解,浓度范围宽(10- 6% - 10-1% wt%),测定元素数量多。为了实现该方法的潜在分析能力,研究了电极间距离、石墨电极的形状和尺寸、Lu2O3与光谱缓冲液的比例、载流子类型和发生器的工作模式等实验条件。大多数元素的检出限为n∙10-6 - n∙10-4 wt%,明显低于现有的直流电弧法。用ICP-MS控制结果的准确性。新方法的复杂应用和光谱设备的现代能力使得开发具有改进的计量特性的方法成为可能。
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Lutetium oxide analysis by direct arc atomic emission spectrometry
The requirements for the composition of initial oxides for the lutetium orthosilicate crystals are quite stringent: the content of the basic substance Lu2O3 is 99.999 wt%. Critical are coloring impurities: Fe, Ni, Cr, Co, Cu, V, Mn, the content of each should be no more than 0.0005 - 0.0010 wt%, Pr, Nd, Sm, Er, Tb, Yb no more than 0.0005 wt% for each one. It is also necessary to control the content of Al, As, Bi, Cd, Mg, Mo, Pb, Sb, Si, Sn, Ti, Zn, Y, La, Ce, Sc, Eu, Gd, Dy, Ho, Tm. To determine the impurity composition of lutetium oxide, one of the promising methods of analysis is direct arc atomic emission spectroscopy (DC Arc). The advantages of this method are the determination of the chemical composition without sample dissolution, a wide range of concentrations (10-6 - 10-1% wt%), a large number of determined elements. To realize the potential analytical capabilities of the method, the experimental conditions were studied: the interelectrode distance, the shape and size of graphite electrodes, the ratio of Lu2O3 to the spectral buffer, the type of carriers and operating modes of the generator. For most elements, the limits of determination are n ∙ 10-6 - n ∙ 10-4 wt%, that is significantly lower than in the current methods of DC Arc. The trueness of results is controlled by ICP-MS. The complex application of new approaches and modern capabilities of spectral equipment made it possible to develop a method with improved metrological characteristics.
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来源期刊
Analitika i Kontrol
Analitika i Kontrol Chemistry-Analytical Chemistry
CiteScore
0.90
自引率
0.00%
发文量
15
期刊介绍: Analitika i Kontrol is a scientific journal covering theoretical and applied aspects of analytical chemistry and analytical control, published since autumn 1997. Founder and publisher of the journal is the Ural Federal University named after the first President of Russia Boris Yeltsin (UrFU, Ekaterinburg).
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