{"title":"具有高提取效率的真随机数发生器节能后处理技术","authors":"Ruilin Zhang, Xingyu Wang, H. Shinohara","doi":"10.1587/TRANSELE.2020CDP0006","DOIUrl":null,"url":null,"abstract":"In this paper, we describe a post-processing technique having high extraction efficiency (ExE) for de-biasing and de-correlating a random bitstream generated by true random number generators (TRNGs). This research is based on the N-bit von Neumann (VN N) post-processing method. It improves the ExE of the original von Neumann method close to the Shannon entropy bound by a large N value. However, as the N value increases, the mapping table complexity increases exponentially (2N ), which makes VN N unsuitable for low-power TRNGs. To overcome this problem, at the algorithm level, we propose a waiting strategy to achieve high ExE with a small N value. At the architectural level, a Hamming weight mapping-based hierarchical structure is used to reconstruct the large mapping table using smaller tables. The hierarchical structure also decreases the correlation factor in the raw bitstream. To develop a technique with high ExE and low cost, we designed and fabricated an 8-bit von Neumann with waiting strategy (VN 8W) in a 130-nm CMOS. The maximum ExE of VN 8W is 62.21%, which is 2.49 times larger than the ExE of the original von Neumann. NIST SP 800-22 randomness test results proved the debiasing and de-correlation abilities of VN 8W. As compared with the stateof-the-art optimized 7-element iterated von Neumann, VN 8W achieved more than 20% energy reduction with higher ExE. At 0.45 V and 1 MHz, VN 8W achieved the minimum energy of 0.18 pJ/bit, which was suitable for sub-pJ low energy TRNGs. key words: post-processing techniques, von Neumann entropy extractor, true random number generator, low-power","PeriodicalId":50384,"journal":{"name":"IEICE Transactions on Electronics","volume":"1 1","pages":""},"PeriodicalIF":0.6000,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Energy-Efficient Post-Processing Technique Having High Extraction Efficiency for True Random Number Generators\",\"authors\":\"Ruilin Zhang, Xingyu Wang, H. Shinohara\",\"doi\":\"10.1587/TRANSELE.2020CDP0006\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we describe a post-processing technique having high extraction efficiency (ExE) for de-biasing and de-correlating a random bitstream generated by true random number generators (TRNGs). This research is based on the N-bit von Neumann (VN N) post-processing method. It improves the ExE of the original von Neumann method close to the Shannon entropy bound by a large N value. However, as the N value increases, the mapping table complexity increases exponentially (2N ), which makes VN N unsuitable for low-power TRNGs. To overcome this problem, at the algorithm level, we propose a waiting strategy to achieve high ExE with a small N value. At the architectural level, a Hamming weight mapping-based hierarchical structure is used to reconstruct the large mapping table using smaller tables. The hierarchical structure also decreases the correlation factor in the raw bitstream. To develop a technique with high ExE and low cost, we designed and fabricated an 8-bit von Neumann with waiting strategy (VN 8W) in a 130-nm CMOS. The maximum ExE of VN 8W is 62.21%, which is 2.49 times larger than the ExE of the original von Neumann. NIST SP 800-22 randomness test results proved the debiasing and de-correlation abilities of VN 8W. As compared with the stateof-the-art optimized 7-element iterated von Neumann, VN 8W achieved more than 20% energy reduction with higher ExE. At 0.45 V and 1 MHz, VN 8W achieved the minimum energy of 0.18 pJ/bit, which was suitable for sub-pJ low energy TRNGs. key words: post-processing techniques, von Neumann entropy extractor, true random number generator, low-power\",\"PeriodicalId\":50384,\"journal\":{\"name\":\"IEICE Transactions on Electronics\",\"volume\":\"1 1\",\"pages\":\"\"},\"PeriodicalIF\":0.6000,\"publicationDate\":\"2021-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEICE Transactions on Electronics\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.1587/TRANSELE.2020CDP0006\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEICE Transactions on Electronics","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1587/TRANSELE.2020CDP0006","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Energy-Efficient Post-Processing Technique Having High Extraction Efficiency for True Random Number Generators
In this paper, we describe a post-processing technique having high extraction efficiency (ExE) for de-biasing and de-correlating a random bitstream generated by true random number generators (TRNGs). This research is based on the N-bit von Neumann (VN N) post-processing method. It improves the ExE of the original von Neumann method close to the Shannon entropy bound by a large N value. However, as the N value increases, the mapping table complexity increases exponentially (2N ), which makes VN N unsuitable for low-power TRNGs. To overcome this problem, at the algorithm level, we propose a waiting strategy to achieve high ExE with a small N value. At the architectural level, a Hamming weight mapping-based hierarchical structure is used to reconstruct the large mapping table using smaller tables. The hierarchical structure also decreases the correlation factor in the raw bitstream. To develop a technique with high ExE and low cost, we designed and fabricated an 8-bit von Neumann with waiting strategy (VN 8W) in a 130-nm CMOS. The maximum ExE of VN 8W is 62.21%, which is 2.49 times larger than the ExE of the original von Neumann. NIST SP 800-22 randomness test results proved the debiasing and de-correlation abilities of VN 8W. As compared with the stateof-the-art optimized 7-element iterated von Neumann, VN 8W achieved more than 20% energy reduction with higher ExE. At 0.45 V and 1 MHz, VN 8W achieved the minimum energy of 0.18 pJ/bit, which was suitable for sub-pJ low energy TRNGs. key words: post-processing techniques, von Neumann entropy extractor, true random number generator, low-power
期刊介绍:
Currently, the IEICE has ten sections nationwide. Each section operates under the leadership of a section chief, four section secretaries and about 20 section councilors. Sections host lecture meetings, seminars and industrial tours, and carry out other activities.
Topics:
Integrated Circuits, Semiconductor Materials and Devices, Quantum Electronics, Opto-Electronics, Superconductive Electronics, Electronic Displays, Microwave and Millimeter Wave Technologies, Vacuum and Beam Technologies, Recording and Memory Technologies, Electromagnetic Theory.