Drasti Patel, H. Reid, Sarah Ball, D. Brett, P. Shearing
{"title":"层状袋状细胞内失效机制特征的x射线计算机断层扫描","authors":"Drasti Patel, H. Reid, Sarah Ball, D. Brett, P. Shearing","doi":"10.1595/205651322x16595441894422","DOIUrl":null,"url":null,"abstract":"Lithium-ion battery (LIB) safety is a multi-scale problem: from the whole-cell architecture to its composite internal 3D microstructures. Substantial research is required to standardise failure assessments and optimise cell designs to reduce the risks of LIB failure. In this work, the failure response of a 1 Ah layered pouch cell with a commercially available NMC cathode and graphite anode at 100 % SOC (4.2 V) is investigated. The mechanisms of two abuse methods; mechanical (by nail penetration) and thermal (by accelerating rate calorimetry) are compared by using a suite of post-mortem analysis methods. Post-mortem whole-cell architectural changes and electrode layer deformations were analysed for both mechanisms using non-invasive X-ray computed tomography. Furthermore, changes to electrode surfaces, bulk microstructures and particle morphologies are compared by following a proposed cell disassembly and post-mortem sample preparation methodology. Building on the insights into critical architectural weak points, electrode behaviours and particle cracks, the reliability of X-ray computed tomography as a guide for LIB failure assessment is demonstrated.","PeriodicalId":14807,"journal":{"name":"Johnson Matthey Technology Review","volume":"1 1","pages":""},"PeriodicalIF":1.7000,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"X-ray Computed Tomography for Failure Mechanism Characterisation within Layered Pouch Cells\",\"authors\":\"Drasti Patel, H. Reid, Sarah Ball, D. Brett, P. Shearing\",\"doi\":\"10.1595/205651322x16595441894422\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Lithium-ion battery (LIB) safety is a multi-scale problem: from the whole-cell architecture to its composite internal 3D microstructures. Substantial research is required to standardise failure assessments and optimise cell designs to reduce the risks of LIB failure. In this work, the failure response of a 1 Ah layered pouch cell with a commercially available NMC cathode and graphite anode at 100 % SOC (4.2 V) is investigated. The mechanisms of two abuse methods; mechanical (by nail penetration) and thermal (by accelerating rate calorimetry) are compared by using a suite of post-mortem analysis methods. Post-mortem whole-cell architectural changes and electrode layer deformations were analysed for both mechanisms using non-invasive X-ray computed tomography. Furthermore, changes to electrode surfaces, bulk microstructures and particle morphologies are compared by following a proposed cell disassembly and post-mortem sample preparation methodology. Building on the insights into critical architectural weak points, electrode behaviours and particle cracks, the reliability of X-ray computed tomography as a guide for LIB failure assessment is demonstrated.\",\"PeriodicalId\":14807,\"journal\":{\"name\":\"Johnson Matthey Technology Review\",\"volume\":\"1 1\",\"pages\":\"\"},\"PeriodicalIF\":1.7000,\"publicationDate\":\"2022-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Johnson Matthey Technology Review\",\"FirstCategoryId\":\"92\",\"ListUrlMain\":\"https://doi.org/10.1595/205651322x16595441894422\",\"RegionNum\":4,\"RegionCategory\":\"化学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"CHEMISTRY, PHYSICAL\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Johnson Matthey Technology Review","FirstCategoryId":"92","ListUrlMain":"https://doi.org/10.1595/205651322x16595441894422","RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"CHEMISTRY, PHYSICAL","Score":null,"Total":0}
X-ray Computed Tomography for Failure Mechanism Characterisation within Layered Pouch Cells
Lithium-ion battery (LIB) safety is a multi-scale problem: from the whole-cell architecture to its composite internal 3D microstructures. Substantial research is required to standardise failure assessments and optimise cell designs to reduce the risks of LIB failure. In this work, the failure response of a 1 Ah layered pouch cell with a commercially available NMC cathode and graphite anode at 100 % SOC (4.2 V) is investigated. The mechanisms of two abuse methods; mechanical (by nail penetration) and thermal (by accelerating rate calorimetry) are compared by using a suite of post-mortem analysis methods. Post-mortem whole-cell architectural changes and electrode layer deformations were analysed for both mechanisms using non-invasive X-ray computed tomography. Furthermore, changes to electrode surfaces, bulk microstructures and particle morphologies are compared by following a proposed cell disassembly and post-mortem sample preparation methodology. Building on the insights into critical architectural weak points, electrode behaviours and particle cracks, the reliability of X-ray computed tomography as a guide for LIB failure assessment is demonstrated.
期刊介绍:
Johnson Matthey Technology Review publishes articles, reviews and short reports on science enabling cleaner air, good health and efficient use of natural resources. Areas of application and fundamental science will be considered in the fields of:Advanced materials[...]Catalysis[...][...]Characterisation[...]Electrochemistry[...]Emissions control[...]Fine and speciality chemicals[...]Historical[...]Industrial processes[...]Materials and metallurgy[...]Modelling[...]PGM and specialist metallurgy[...]Pharmaceutical and medical science[...]Surface chemistry and coatings[...]Sustainable technologies.