石墨烯的扫描隧道显微镜(STM)

A. D. Parga, R. Miranda
{"title":"石墨烯的扫描隧道显微镜(STM)","authors":"A. D. Parga, R. Miranda","doi":"10.1533/9780857099334.2.124","DOIUrl":null,"url":null,"abstract":"Abstract: The use of scanning tunneling microscopy and spectroscopy for the characterization of graphene grown or deposited on different substrates is described. The influence of the substrates on the morphology and electronic structure of graphene is discussed. Experimental methods for the characterization of individual defects on the graphene network are described and studies on the fabrication of graphene nanoribbons and examination of the electronic structure of the edges are outlined.","PeriodicalId":63892,"journal":{"name":"石墨烯(英文)","volume":"1 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1533/9780857099334.2.124","citationCount":"1","resultStr":"{\"title\":\"Scanning tunneling microscopy (STM) of graphene\",\"authors\":\"A. D. Parga, R. Miranda\",\"doi\":\"10.1533/9780857099334.2.124\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Abstract: The use of scanning tunneling microscopy and spectroscopy for the characterization of graphene grown or deposited on different substrates is described. The influence of the substrates on the morphology and electronic structure of graphene is discussed. Experimental methods for the characterization of individual defects on the graphene network are described and studies on the fabrication of graphene nanoribbons and examination of the electronic structure of the edges are outlined.\",\"PeriodicalId\":63892,\"journal\":{\"name\":\"石墨烯(英文)\",\"volume\":\"1 1\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1533/9780857099334.2.124\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"石墨烯(英文)\",\"FirstCategoryId\":\"1089\",\"ListUrlMain\":\"https://doi.org/10.1533/9780857099334.2.124\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"石墨烯(英文)","FirstCategoryId":"1089","ListUrlMain":"https://doi.org/10.1533/9780857099334.2.124","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

摘要:本文描述了使用扫描隧道显微镜和光谱学来表征在不同衬底上生长或沉积的石墨烯。讨论了衬底对石墨烯形貌和电子结构的影响。描述了表征石墨烯网络上单个缺陷的实验方法,概述了石墨烯纳米带的制备和边缘电子结构检测的研究。
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Scanning tunneling microscopy (STM) of graphene
Abstract: The use of scanning tunneling microscopy and spectroscopy for the characterization of graphene grown or deposited on different substrates is described. The influence of the substrates on the morphology and electronic structure of graphene is discussed. Experimental methods for the characterization of individual defects on the graphene network are described and studies on the fabrication of graphene nanoribbons and examination of the electronic structure of the edges are outlined.
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