Yiming Ouyang, Guilin Huang, Huaguo Liang, Tao Xie, Zhengfeng Huang
{"title":"使用少量相关位测试片上系统(SoC)的数据压缩:使用少量相关位测试片上系统(SoC)的数据压缩","authors":"Yiming Ouyang, Guilin Huang, Huaguo Liang, Tao Xie, Zhengfeng Huang","doi":"10.3724/SP.J.1187.2013.00076","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":58398,"journal":{"name":"电子测量与仪器学报","volume":"27 1","pages":"76-82"},"PeriodicalIF":0.0000,"publicationDate":"2013-11-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Test data compression of system-on-chip (SoC) using few relevant bits: Test data compression of system-on-chip (SoC) using few relevant bits\",\"authors\":\"Yiming Ouyang, Guilin Huang, Huaguo Liang, Tao Xie, Zhengfeng Huang\",\"doi\":\"10.3724/SP.J.1187.2013.00076\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":58398,\"journal\":{\"name\":\"电子测量与仪器学报\",\"volume\":\"27 1\",\"pages\":\"76-82\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-11-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"电子测量与仪器学报\",\"FirstCategoryId\":\"1087\",\"ListUrlMain\":\"https://doi.org/10.3724/SP.J.1187.2013.00076\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"电子测量与仪器学报","FirstCategoryId":"1087","ListUrlMain":"https://doi.org/10.3724/SP.J.1187.2013.00076","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}