SrBi1.8Ce0.2Ta2O9的合成、结构及介电性能

M. Afqir, A. Tachafine, D. Fasquelle, M. Elaatmani, J. Carru, A. Zegzouti, M. Daoud
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引用次数: 1

摘要

采用固相反应法制备了掺杂铈的钽酸锶铋SrBi1.8Ce0.2Ta2O9。用x射线衍射测定了粉末的晶体结构。测量了SrBi1.8Ce0.2Ta2O9样品的拉曼光谱,证实了x射线衍射结果。用扫描电镜观察了陶瓷的微观结构。研究了陶瓷介电性能在室温至400℃范围内的温度依赖性。
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Synthesis, Structural and Dielectric Properties of SrBi1.8Ce0.2Ta2O9
This Ce-doped strontium bismuth tantalate SrBi1.8Ce0.2Ta2O9 was prepared by solid-state reaction. X-ray diffraction was used to determine the crystal structure of the powders. The Raman spectrum of SrBi1.8Ce0.2Ta2O9 sample was measured to confirm X-ray diffraction result. The microstructure of ceramic was observed by Scanning Electron Microscope (SEM). The Temperature dependence of the dielectric properties of ceramic was investigated from the room temperature to 400°C.
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