微波辐照大面积c60薄膜的微观结构表征

Jacobo Martínez-Reyes, L. D. Barriga-Arceo, L. Rendón-Vázquez, R. Martínez-Guerrero, N. Romero-Partida, E. Palacios-González, V. Garibay-Feblés, J. Ortiz-Lopez
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引用次数: 3

摘要

本文报道了以樟脑树脂为原料,在常规微波炉中合成C60的方法。通过x射线衍射(XRD)对样品的多晶结构进行了表征,样品显示出多相结构,主要相对应于以面心立方结构(FCC)有序排列的富勒烯C60,另外还有两种结构:一种是正交体系,另一种是单斜体系,并与石墨2H相共存。在扫描电子显微镜(SEM)下观察到,样品形成了堆叠的碳薄膜。在高分辨率透射电子显微镜(HRTEM)中,在明亮场模式下的测量表明,材料的主要相是FCC结构的C60,并且可以通过电子显微镜的能量分析(EELS)来确定元素组成和原子键合状态,该技术允许通过XRD观察证实所有C60相。
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Microstructural Characterization of Large Area C 60 Films Obtained by Conventional Microwave Oven Irradiation
In the present work the synthesis of C60 produced in a conventional microwave oven from the decomposition of camphor resin is reported. The polycrystalline structure of the sample was determined by X-Ray Diffraction (XRD), the sample showed several phases, the main phase corresponds to fullerene C60 ordered in a Face-Centered Cubic structure (FCC), with two more structures: one orthorhombic system and the other the monoclinic system coexisting also with graphite 2H phase. It was observed in a Scanning Electron Microscopy (SEM), that the sample formed thin films of stacked carbon. Whereas in a High Resolution Transmission Electron Microscopy (HRTEM), measurements in Bright Field mode revealed that the main phase of the material is C60 ordered in FCC structure and the elemental composition and atomic bonding state can be determined by analyzing the energy with the electron microscope by Elesctron Energy- Loss Spectroscopy (EELS), technique allowed confirm all the phase C60 established with XRD observations.
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