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引用次数: 2
摘要
介绍了一种新的表面测定方法——光电法。其测量原理的特征在于测量在光电效应的第一次测量中未覆盖的硒光电元件和在第二次测量中被待测量物体覆盖的硒光电子元件的光电流的差异。测量装置由光源、带有金属干涉滤光片的光学系统(制造商:VEB Schott&;Gen.Jena)、,大型硒光电元件(制造商:VEB Carl Zeiss Jena)和具有并联连接的电位计的刻度电流计(VEB CarlZeiss Jenna)。对于精密测量,仅使用总可用面积的一个30×180 mm的矩形。该部分区域显示出足够的串联测量精度(平均误差±1%)。光电区域测定中出现的主要误差来源。进行了讨论。所描述的测量装置适用于电子光学以及电子光学和其他辐射波长的比率。