薄膜有机电子中微观结构相关性能的工艺优化

Spencer Pfeifer , Balaji Sesha Sarath Pokuri , Pengfei Du, Baskar Ganapathysubramanian
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引用次数: 12

摘要

薄膜有机电子器件的基于溶剂的制造过程中的处理条件显著地决定了随后的微观结构。微观结构反过来又是器件性能的关键决定因素之一。近年来,有机电子学的焦点之一是确定提高性能的加工条件。传统上,这涉及试错探索,或对大空间的处理条件进行参数扫描,这两者都是时间和资源密集型的。当流程→ 结构→ 财产模拟器的评估在计算上是昂贵的。在这项工作中,我们将基于自适应采样的、无梯度的贝叶斯优化程序与相场形态进化框架相结合,该框架对基于溶剂的薄膜聚合物共混物的制造(过程→ 结构模拟器)和基于图形的形态表征框架,该框架评估给定形态(结构→ 属性模拟器)。贝叶斯优化例程自适应地调整处理参数,以快速识别最佳处理配置,从而减少过程中的计算工作量→ 结构→ 房地产勘探。这是一个模块化的、并行的“包装器”框架,有助于在其他过程模拟器和设备模拟器中交换通用过程→ 结构→ 属性优化。我们通过在一个模型系统中确定溶剂蒸发率和衬底图案化波长这两个工艺参数来展示这一框架,该模型系统使器件具有增强的光伏性能,并将其评估为器件的短路电流。本文提出的方法提供了一种模块化、可扩展和可扩展的方法,用于合理设计具有增强功能的定制微结构。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

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Process optimization for microstructure-dependent properties in thin film organic electronics

The processing conditions during solvent-based fabrication of thin film organic electronics significantly determine the ensuing microstructure. The microstructure, in turn, is one of the key determinants of device performance. In recent years, one of the foci in organic electronics has been to identify processing conditions for enhanced performance. This has traditionally involved either trial-and-error exploration, or a parametric sweep of a large space of processing conditions, both of which are time and resource intensive. This is especially the case when the process → structure and structure → property simulators are computationally expensive to evaluate.

In this work, we integrate an adaptive-sampling based, gradient-free, Bayesian optimization routine with a phase-field morphology evolution framework that models solvent-based fabrication of thin film polymer blends (process → structure simulator) and a graph-based morphology characterization framework that evaluates the photovoltaic performance of a given morphology (structure → property simulator). The Bayesian optimization routine adaptively adjusts the processing parameters to rapidly identify optimal processing configurations, thus reducing the computational effort in processstructureproperty explorations. This serves as a modular, parallel ‘wrapper’ framework that facilitates swapping-in other process simulators and device simulators for general process → structure → property optimization. We showcase this framework by identifying two processing parameters, the solvent evaporation rate and the substrate patterning wavelength, in a model system that results in a device with enhanced photovoltaic performance evaluated as the short-circuit current of the device. The methodology presented here provides a modular, scalable and extensible approach towards the rational design of tailored microstructures with enhanced functionalities.

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