F. R. Moreno, S. Cordova, Héctor Alej, R. Molina, Homero Jaime Rodríguez Centeno, G. Badilla
{"title":"电子工业中环境因素与金属表面劣化的新分析方法","authors":"F. R. Moreno, S. Cordova, Héctor Alej, R. Molina, Homero Jaime Rodríguez Centeno, G. Badilla","doi":"10.4172/0976-4860.1000214","DOIUrl":null,"url":null,"abstract":"Based on the use of industrial and computing engineering tools, a new method was developed with a VEGAM matrix for the rapid and effective detection of the effects of the environment (climate and air pollution) on equipment and machines used in the electronics industry. This was done with a staff developed by experts from the National Technological Institute based in the Technological Institute of Mexicali, obtaining an efficiency of 95% in its application in the electronic industry of the city of Mexicali.","PeriodicalId":90538,"journal":{"name":"International journal of advancements in computing technology","volume":"266 6","pages":"1-6"},"PeriodicalIF":0.0000,"publicationDate":"2018-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"New Analysis Methodology to Evaluate the Environmental Factors and the Deterioration of Metallic Surfaces in the Electronics Industry\",\"authors\":\"F. R. Moreno, S. Cordova, Héctor Alej, R. Molina, Homero Jaime Rodríguez Centeno, G. Badilla\",\"doi\":\"10.4172/0976-4860.1000214\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Based on the use of industrial and computing engineering tools, a new method was developed with a VEGAM matrix for the rapid and effective detection of the effects of the environment (climate and air pollution) on equipment and machines used in the electronics industry. This was done with a staff developed by experts from the National Technological Institute based in the Technological Institute of Mexicali, obtaining an efficiency of 95% in its application in the electronic industry of the city of Mexicali.\",\"PeriodicalId\":90538,\"journal\":{\"name\":\"International journal of advancements in computing technology\",\"volume\":\"266 6\",\"pages\":\"1-6\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International journal of advancements in computing technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.4172/0976-4860.1000214\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International journal of advancements in computing technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.4172/0976-4860.1000214","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
New Analysis Methodology to Evaluate the Environmental Factors and the Deterioration of Metallic Surfaces in the Electronics Industry
Based on the use of industrial and computing engineering tools, a new method was developed with a VEGAM matrix for the rapid and effective detection of the effects of the environment (climate and air pollution) on equipment and machines used in the electronics industry. This was done with a staff developed by experts from the National Technological Institute based in the Technological Institute of Mexicali, obtaining an efficiency of 95% in its application in the electronic industry of the city of Mexicali.
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