单晶硅在碱性溶液中的蚀刻

T. Baum, D. Schiffrin
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引用次数: 38

摘要

根据(100)和(111)表面五配位过渡态硅的原子构型,讨论了单晶硅在碱性溶液中溶解时化学各向异性的起源。提出以四面体结构成键的四价硅在蚀刻过程中受到氢氧根离子的攻击,形成五配位过渡态。由于表面原子排列固定了键角的数量,五配位配合物的能量有利的三角双锥体几何结构在前一个平面上仅轻微扭曲,但在后一个平面上明显扭曲,导致(111)表面溶解的活化能更高。由过渡态位阻引起的Si(100)和Si(111)表面溶解的活化能差异,可以由类似体系的伪旋转的活化能来估计。
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Mechanistic aspects of anisotropic dissolution of materials Etching of single-crystal silicon in alkaline solutions
The origin of chemical anisotropy in the dissolution of single-crystal silicon in alkaline solutions is discussed in terms of the atomic configuration of silicon in the pentacoordinated transition state for (100) and (111) surfaces. It is proposed that tetravalent silicon, which is bonded in a tetrahedral geometry, is attacked in the etch process by the hydroxide ion, forming a pentacoordinated transition state. Owing to the number of bond angles that are fixed by the atomic arrangement at the surface, the energetically favoured trigonal bipyramidal geometry for a pentacoordinated complex is only slightly distorted for the former plane but significantly distorted for the latter, resulting in a higher activation energy for the dissolution of (111) surfaces. The difference in the activation energies for the dissolution of Si(100) and (111) surfaces, arising from steric hindrance in the transition state, can be estimated from the activation energy for a pseudo-rotation of a similar system.
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