利用原子力显微镜监测高分子涂层表面的物理降解

{"title":"利用原子力显微镜监测高分子涂层表面的物理降解","authors":"M. Vanlandingham, T. Nguyen, W. E. Byrd, Jon Martin","doi":"10.1007/BF02720133","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":15467,"journal":{"name":"Journal of Coatings Technology","volume":"62 1","pages":"43-50"},"PeriodicalIF":0.0000,"publicationDate":"2001-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"27","resultStr":"{\"title\":\"On the use of the atomic force microscope to monitor physical degradation of polymeric coating surfaces\",\"authors\":\"M. Vanlandingham, T. Nguyen, W. E. Byrd, Jon Martin\",\"doi\":\"10.1007/BF02720133\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":15467,\"journal\":{\"name\":\"Journal of Coatings Technology\",\"volume\":\"62 1\",\"pages\":\"43-50\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"27\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Coatings Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1007/BF02720133\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Coatings Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/BF02720133","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}