I. Ali, A. Ginart, J. Goldin, P. Kalgren, M. Roemer, S. Poll
{"title":"传感诊断致动器功率驱动系统中功率半导体老化的新应用","authors":"I. Ali, A. Ginart, J. Goldin, P. Kalgren, M. Roemer, S. Poll","doi":"10.1109/AERO.2012.6187388","DOIUrl":null,"url":null,"abstract":"This paper presents a new sensing application to diagnose power semiconductor aging in power drive systems. It has been shown previously that device parasitic characteristics change during the aging process which results in detectable changes in their frequency response. This change is manifested in the current signal at very high frequencies. Therefore, using a wideband AC current sensor, high frequency components of the current can be acquired, providing a way to detect device aging.","PeriodicalId":6421,"journal":{"name":"2012 IEEE Aerospace Conference","volume":"5 1","pages":"1-9"},"PeriodicalIF":0.0000,"publicationDate":"2012-03-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"New sensing application to diagnose power semiconductor aging in actuator power drive systems\",\"authors\":\"I. Ali, A. Ginart, J. Goldin, P. Kalgren, M. Roemer, S. Poll\",\"doi\":\"10.1109/AERO.2012.6187388\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a new sensing application to diagnose power semiconductor aging in power drive systems. It has been shown previously that device parasitic characteristics change during the aging process which results in detectable changes in their frequency response. This change is manifested in the current signal at very high frequencies. Therefore, using a wideband AC current sensor, high frequency components of the current can be acquired, providing a way to detect device aging.\",\"PeriodicalId\":6421,\"journal\":{\"name\":\"2012 IEEE Aerospace Conference\",\"volume\":\"5 1\",\"pages\":\"1-9\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-03-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 IEEE Aerospace Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AERO.2012.6187388\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE Aerospace Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AERO.2012.6187388","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
New sensing application to diagnose power semiconductor aging in actuator power drive systems
This paper presents a new sensing application to diagnose power semiconductor aging in power drive systems. It has been shown previously that device parasitic characteristics change during the aging process which results in detectable changes in their frequency response. This change is manifested in the current signal at very high frequencies. Therefore, using a wideband AC current sensor, high frequency components of the current can be acquired, providing a way to detect device aging.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
