Lavanya Mandava, L. Xing, V. Vokkarane, O. Tannous
{"title":"元件级覆盖不完善的多状态云- raid可靠性分析","authors":"Lavanya Mandava, L. Xing, V. Vokkarane, O. Tannous","doi":"10.1201/9781351130363-4","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":101070,"journal":{"name":"Reliability Engineering","volume":"13 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2018-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Reliability Analysis of Multi‑State Cloud-RAID with Imperfect Element-Level Coverage\",\"authors\":\"Lavanya Mandava, L. Xing, V. Vokkarane, O. Tannous\",\"doi\":\"10.1201/9781351130363-4\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":101070,\"journal\":{\"name\":\"Reliability Engineering\",\"volume\":\"13 1\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-10-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Reliability Engineering\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1201/9781351130363-4\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Reliability Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1201/9781351130363-4","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}