标准CMOS图像传感器过程中的高转换增益像素

2017 IEEE Photonics Conference (IPC) Part II Pub Date : 2017-10-01 DOI:10.1109/IPCON.2017.8116195

Song Chen, E. Fossum

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引用次数: 1

摘要

本文提出了一种在标准0.18 um CMOS图像传感器工艺中实现高像素转换增益的新技术。在原型传感器中测量了121 uV/e-的CG和3.2 erms的读取噪声。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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High conversion-gain pixels in a standard CMOS image sensor process

This paper presents a new technique to achieve high pixel conversion gain (CG) in a standard 0.18 um CMOS image sensor process. CG of 121 uV/e- and read noise of 3.2 erms are measured in the prototype sensor.

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2017 IEEE Photonics Conference (IPC) Part II

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