用AES, EDX, RBS和电子显微镜表征共蒸发FeSix薄膜的化学计量学

A. Schöpke, B. Selle, I. Sieber, G. Reinsperger, P. Stauss, K. Herz, M. Powalla
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Characterization of the stoichiometry of coevaporated FeSix films by AES, EDX, RBS, and electron microscopy
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