原子力显微镜图像中DNA片段长度的测定

T. Spisz, N. D'Costa, C. K. Seymour, J. Hoh, R. Reeves, I. Bankman
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引用次数: 5

摘要

开发了一种处理算法来检测和确定原子力显微镜图像中DNA片段的长度。该算法旨在考虑不同的图像条件,片段大小和背景污染,同时最大限度地减少处理时间,以提供高吞吐量。虽然还没有测试足够大的图像样本来精确地确定精度,但根据对理想模拟图像和实际图像的分析,我们估计精度在2像素以内。
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Length determination of DNA fragments in atomic force microscope images
A processing algorithm was developed to detect and determine the lengths of DNA fragments in atomic force microscope images. The algorithm was designed to account for varying image conditions, fragment sizes, and background contamination, while minimizing the processing time to provide a high throughput. Although a large enough sample of images has not been tested yet to determine precisely the accuracy, we estimate the accuracy to be within 2 pixels based on analysis of an ideal simulated image and an actual image.
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Computer Analysis of Images and Patterns: 19th International Conference, CAIP 2021, Virtual Event, September 28–30, 2021, Proceedings, Part I Computer Analysis of Images and Patterns: 19th International Conference, CAIP 2021, Virtual Event, September 28–30, 2021, Proceedings, Part II Computer Analysis of Images and Patterns: CAIP 2019 International Workshops, ViMaBi and DL-UAV, Salerno, Italy, September 6, 2019, Proceedings Computer Analysis of Images and Patterns: 18th International Conference, CAIP 2019, Salerno, Italy, September 3–5, 2019, Proceedings, Part I Computer Analysis of Images and Patterns: 18th International Conference, CAIP 2019, Salerno, Italy, September 3–5, 2019, Proceedings, Part II
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