{"title":"基于Harris广义线性指数分布的百分位数可靠性检验方案","authors":"K. K. Jose, Albin Paul","doi":"10.1515/eqc-2017-0025","DOIUrl":null,"url":null,"abstract":"Abstract In this paper, a generalization of the Harris family of distributions, namely, the Harris generalized linear exponential distribution is discussed. The use of the model is established by fitting it to a real data set. Also, we derive a reliability test plan for acceptance or rejection of a lot of products submitted for inspection with lifetimes following this distribution.","PeriodicalId":37499,"journal":{"name":"Stochastics and Quality Control","volume":"124 1","pages":"61 - 70"},"PeriodicalIF":0.0000,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Reliability Test Plans for Percentiles Based on the Harris Generalized Linear Exponential Distribution\",\"authors\":\"K. K. Jose, Albin Paul\",\"doi\":\"10.1515/eqc-2017-0025\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Abstract In this paper, a generalization of the Harris family of distributions, namely, the Harris generalized linear exponential distribution is discussed. The use of the model is established by fitting it to a real data set. Also, we derive a reliability test plan for acceptance or rejection of a lot of products submitted for inspection with lifetimes following this distribution.\",\"PeriodicalId\":37499,\"journal\":{\"name\":\"Stochastics and Quality Control\",\"volume\":\"124 1\",\"pages\":\"61 - 70\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Stochastics and Quality Control\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1515/eqc-2017-0025\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"Mathematics\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Stochastics and Quality Control","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1515/eqc-2017-0025","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"Mathematics","Score":null,"Total":0}
Reliability Test Plans for Percentiles Based on the Harris Generalized Linear Exponential Distribution
Abstract In this paper, a generalization of the Harris family of distributions, namely, the Harris generalized linear exponential distribution is discussed. The use of the model is established by fitting it to a real data set. Also, we derive a reliability test plan for acceptance or rejection of a lot of products submitted for inspection with lifetimes following this distribution.
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