对几代“你只看一次”的架构进行基准测试，以检测有缺陷和正常的长棒绝缘子

{"title":"对几代“你只看一次”的架构进行基准测试，以检测有缺陷和正常的长棒绝缘子","authors":"Gergő Bendegúz Békési","doi":"10.1007/s40313-023-01023-3","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":46750,"journal":{"name":"Journal of Control Automation and Electrical Systems","volume":null,"pages":null},"PeriodicalIF":1.5000,"publicationDate":"2023-07-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Benchmarking Generations of You Only Look Once Architectures for Detection of Defective and Normal Long Rod Insulators\",\"authors\":\"Gergő Bendegúz Békési\",\"doi\":\"10.1007/s40313-023-01023-3\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":46750,\"journal\":{\"name\":\"Journal of Control Automation and Electrical Systems\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":1.5000,\"publicationDate\":\"2023-07-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Control Automation and Electrical Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1007/s40313-023-01023-3\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"AUTOMATION & CONTROL SYSTEMS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Control Automation and Electrical Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/s40313-023-01023-3","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"AUTOMATION & CONTROL SYSTEMS","Score":null,"Total":0}