J. Herion, K. Szot, S. Barzen, F. Siebke, M. Teske
{"title":"氢化非晶硅的AFM和STM研究:形貌和势垒高度","authors":"J. Herion, K. Szot, S. Barzen, F. Siebke, M. Teske","doi":"10.1007/S002160050423","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"29 1","pages":"338-340"},"PeriodicalIF":0.0000,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"AFM and STM investigations of hydrogenated amorphous silicon: topography and barrier heights\",\"authors\":\"J. Herion, K. Szot, S. Barzen, F. Siebke, M. Teske\",\"doi\":\"10.1007/S002160050423\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":12375,\"journal\":{\"name\":\"Fresenius' Journal of Analytical Chemistry\",\"volume\":\"29 1\",\"pages\":\"338-340\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-05-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Fresenius' Journal of Analytical Chemistry\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1007/S002160050423\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Fresenius' Journal of Analytical Chemistry","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/S002160050423","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}