微流体学6:PDMS芯片，光学质量控制和流量泄漏测试v1

{"title":"微流体学6:PDMS芯片，光学质量控制和流量泄漏测试v1","authors":"Serhat Sevli","doi":"10.17504/protocols.io.bxkvpkw6","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":20882,"journal":{"name":"protocols.io","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2021-08-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Microfluidics 6: PDMS Chip, Optical Quality Control and Flow Leakage Test v1\",\"authors\":\"Serhat Sevli\",\"doi\":\"10.17504/protocols.io.bxkvpkw6\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":20882,\"journal\":{\"name\":\"protocols.io\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-08-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"protocols.io\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.17504/protocols.io.bxkvpkw6\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"protocols.io","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.17504/protocols.io.bxkvpkw6","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}