{"title":"VANETs中不当行为检测及时性的建模","authors":"M. M. Lucena, A. A. Fröhlich","doi":"10.1109/ETFA52439.2022.9921605","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":6522,"journal":{"name":"2017 22nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)","volume":"1 1","pages":"1-8"},"PeriodicalIF":0.0000,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Modeling Misbehavior Detection Timeliness in VANETs\",\"authors\":\"M. M. Lucena, A. A. Fröhlich\",\"doi\":\"10.1109/ETFA52439.2022.9921605\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":6522,\"journal\":{\"name\":\"2017 22nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)\",\"volume\":\"1 1\",\"pages\":\"1-8\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 22nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ETFA52439.2022.9921605\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 22nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETFA52439.2022.9921605","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}