故障恢复数字电路的电子元件基础

IF 0.2 4区 计算机科学 Q4 COMPUTER SCIENCE, THEORY & METHODS Rairo-Theoretical Informatics and Applications Pub Date : 2021-12-30 DOI:10.14357/19922264210409
{"title":"故障恢复数字电路的电子元件基础","authors":"","doi":"10.14357/19922264210409","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":54510,"journal":{"name":"Rairo-Theoretical Informatics and Applications","volume":null,"pages":null},"PeriodicalIF":0.2000,"publicationDate":"2021-12-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"THE ELECTRONIC COMPONENT BASE OF FAILURE RESILIENCE DIGITAL CIRCUITS\",\"authors\":\"\",\"doi\":\"10.14357/19922264210409\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":54510,\"journal\":{\"name\":\"Rairo-Theoretical Informatics and Applications\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.2000,\"publicationDate\":\"2021-12-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Rairo-Theoretical Informatics and Applications\",\"FirstCategoryId\":\"94\",\"ListUrlMain\":\"https://doi.org/10.14357/19922264210409\",\"RegionNum\":4,\"RegionCategory\":\"计算机科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"COMPUTER SCIENCE, THEORY & METHODS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Rairo-Theoretical Informatics and Applications","FirstCategoryId":"94","ListUrlMain":"https://doi.org/10.14357/19922264210409","RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"COMPUTER SCIENCE, THEORY & METHODS","Score":null,"Total":0}
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THE ELECTRONIC COMPONENT BASE OF FAILURE RESILIENCE DIGITAL CIRCUITS
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来源期刊
Rairo-Theoretical Informatics and Applications
Rairo-Theoretical Informatics and Applications 工程技术-计算机:信息系统
CiteScore
0.80
自引率
0.00%
发文量
6
审稿时长
>12 weeks
期刊介绍: The journal publishes original research papers of high scientific level in the area of theoretical computer science and its applications. Theoretical computer science is understood in its broadest sense and comprises in particular the following areas: automata and formal languages, game theory, rewriting systems, design and analysis of algorithms, complexity theory, quantum computation, concurrent, distributed, parallel computations, verification of programs, “logic” and compilers, computational geometry and graphics on computers, cryptography, combinatorics on words. This list is not supposed to be exhaustive and the editorial board will promote new fields of research that will be worked out in the future.
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