{"title":"探针形状对无孔径太赫兹近场显微镜近场增强的影响","authors":"V. N. Trukhin, A. Golubok, L. L. Samoilov","doi":"10.1109/IRMMW-THZ.2011.6104848","DOIUrl":null,"url":null,"abstract":"We report on the experimental study of the probe shape dependency on terahertz near-field enhancement near the tip of a metallic probe in the apertureless terahertz scanning near-field microscope. It was established that terahertz near-field signal is strongly controlled by the cone shape of the probe and varies by an order of magnitude depending on the shape of the probe.","PeriodicalId":6353,"journal":{"name":"2011 International Conference on Infrared, Millimeter, and Terahertz Waves","volume":"227 1","pages":"1-1"},"PeriodicalIF":0.0000,"publicationDate":"2011-12-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Probe shape effect on near-field enhancement in apertureless terahertz near-field microscope\",\"authors\":\"V. N. Trukhin, A. Golubok, L. L. Samoilov\",\"doi\":\"10.1109/IRMMW-THZ.2011.6104848\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We report on the experimental study of the probe shape dependency on terahertz near-field enhancement near the tip of a metallic probe in the apertureless terahertz scanning near-field microscope. It was established that terahertz near-field signal is strongly controlled by the cone shape of the probe and varies by an order of magnitude depending on the shape of the probe.\",\"PeriodicalId\":6353,\"journal\":{\"name\":\"2011 International Conference on Infrared, Millimeter, and Terahertz Waves\",\"volume\":\"227 1\",\"pages\":\"1-1\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-12-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 International Conference on Infrared, Millimeter, and Terahertz Waves\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IRMMW-THZ.2011.6104848\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 International Conference on Infrared, Millimeter, and Terahertz Waves","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRMMW-THZ.2011.6104848","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Probe shape effect on near-field enhancement in apertureless terahertz near-field microscope
We report on the experimental study of the probe shape dependency on terahertz near-field enhancement near the tip of a metallic probe in the apertureless terahertz scanning near-field microscope. It was established that terahertz near-field signal is strongly controlled by the cone shape of the probe and varies by an order of magnitude depending on the shape of the probe.