{"title":"基于bpmn的流程驱动应用程序的半自动测试迁移","authors":"Konrad Schneid, S. Thöne, H. Kuchen","doi":"10.1007/978-3-031-17604-3_14","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":6544,"journal":{"name":"2018 IEEE 22nd International Enterprise Distributed Object Computing Conference (EDOC)","volume":"157 1","pages":"237-254"},"PeriodicalIF":0.0000,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Semi-automated Test Migration for BPMN-Based Process-Driven Applications\",\"authors\":\"Konrad Schneid, S. Thöne, H. Kuchen\",\"doi\":\"10.1007/978-3-031-17604-3_14\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":6544,\"journal\":{\"name\":\"2018 IEEE 22nd International Enterprise Distributed Object Computing Conference (EDOC)\",\"volume\":\"157 1\",\"pages\":\"237-254\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE 22nd International Enterprise Distributed Object Computing Conference (EDOC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1007/978-3-031-17604-3_14\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE 22nd International Enterprise Distributed Object Computing Conference (EDOC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-031-17604-3_14","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1