P. Bourgeois, T. Imaike, G. Goavec-Mérou, E. Rubiola
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We report on the measurement of phase noise of high speed analog to digital converters in a full digital measurement setup and for various development boards. The tested configurations ensures a Nyquist rate higher than 100 MHz suitable for conventional ultralow noise devices. Several analog to digital converters featuring a SNR higher than 140 dB enable the measurement of AM and PM noise with a background noise of -185 dBc (floor) and -160 dBc (flicker, 10 Hz off the carrier) using cross-correlation technique.
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