{"title":"局部放电模式的物理模拟","authors":"R. Patsch, M. Hoof","doi":"10.1109/ICSD.1998.709239","DOIUrl":null,"url":null,"abstract":"Partial discharge phenomena in which solid dielectrics are involved can be simulated by a mainly deterministic physical model. The comparison of computer simulations with measured partial discharge data shows that in each case only one or two of the model parameters are responsible for the different behaviour of different defects.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"72 1","pages":"114-118"},"PeriodicalIF":0.0000,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"21","resultStr":"{\"title\":\"Physical modeling of partial discharge patterns\",\"authors\":\"R. Patsch, M. Hoof\",\"doi\":\"10.1109/ICSD.1998.709239\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Partial discharge phenomena in which solid dielectrics are involved can be simulated by a mainly deterministic physical model. The comparison of computer simulations with measured partial discharge data shows that in each case only one or two of the model parameters are responsible for the different behaviour of different defects.\",\"PeriodicalId\":13148,\"journal\":{\"name\":\"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)\",\"volume\":\"72 1\",\"pages\":\"114-118\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-06-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"21\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICSD.1998.709239\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSD.1998.709239","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Partial discharge phenomena in which solid dielectrics are involved can be simulated by a mainly deterministic physical model. The comparison of computer simulations with measured partial discharge data shows that in each case only one or two of the model parameters are responsible for the different behaviour of different defects.