具有补偿温度控制的量热测量

S. Bolte, L. Keuck, Jehan Khan Afridi, N. Fröhleke, J. Böcker
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引用次数: 3

摘要

测量低功率因数的快速开关半导体或磁性元件的耗散功率对测量设备的精度提出了很高的要求。量热测量方法是解决这一问题的一种可能方法,但被认为耗时太长。补偿温度控制有助于减少单次测量从240到30分钟的时间需求。实验结果证明了该测量方法的准确性。
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Calorimetric measurements with compensating temperature control
Measuring the dissipated power of fast switching semiconductors or magnetic components with low power factor makes high demands on the accuracy of the measurement equipment. Calorimetric measurement methods represent a possible solution for this problem but are considered as being too time demanding. A compensating temperature control facilitates to reduce the time demand for a single measurement from 240 to 30 minutes. Experimental results demonstrate the accuracy of the proposed measurement method.
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