{"title":"通过电介质堆叠的隧道时间","authors":"N. Rutter, S. Polyakov, P. Lett, A. Migdall","doi":"10.1109/QELS.2008.4552995","DOIUrl":null,"url":null,"abstract":"We measure the photon tunneling time through bandgaps of dielectric layer stacks with alternating refractive indices. We observe subtle structural changes in dielectric stacks drastically affecting photon traversal times, allowing for sub- and superluminal effects.","PeriodicalId":6382,"journal":{"name":"2008 Conference on Lasers and Electro-Optics and 2008 Conference on Quantum Electronics and Laser Science","volume":"134 1","pages":"1-2"},"PeriodicalIF":0.0000,"publicationDate":"2008-05-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Tunneling times through dielectric stacks\",\"authors\":\"N. Rutter, S. Polyakov, P. Lett, A. Migdall\",\"doi\":\"10.1109/QELS.2008.4552995\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We measure the photon tunneling time through bandgaps of dielectric layer stacks with alternating refractive indices. We observe subtle structural changes in dielectric stacks drastically affecting photon traversal times, allowing for sub- and superluminal effects.\",\"PeriodicalId\":6382,\"journal\":{\"name\":\"2008 Conference on Lasers and Electro-Optics and 2008 Conference on Quantum Electronics and Laser Science\",\"volume\":\"134 1\",\"pages\":\"1-2\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-05-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 Conference on Lasers and Electro-Optics and 2008 Conference on Quantum Electronics and Laser Science\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/QELS.2008.4552995\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 Conference on Lasers and Electro-Optics and 2008 Conference on Quantum Electronics and Laser Science","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/QELS.2008.4552995","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
We measure the photon tunneling time through bandgaps of dielectric layer stacks with alternating refractive indices. We observe subtle structural changes in dielectric stacks drastically affecting photon traversal times, allowing for sub- and superluminal effects.