电化学沉积掺锡硒化锌(SnZnSe)薄膜材料

I. Ikhioya, D. Okoli, Azibuike J. Ekpunobic
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引用次数: 4

摘要

在本研究中,SnZnSe薄膜材料的生长采用阳离子前驱体(0.035 mol ZnSO4.7H2O水溶液)和阴离子前驱体(0.1 mol金属硒粉溶液,用4 mL氯化氢溶解)进行。在掺杂浓度为1%、2%、3%和4%的FTO衬底上沉积的薄膜的XRD显示,反射峰位于(220)、(221)、(300)、(310)、(311)、(222)和(320),晶格常数为a=7.189 Ǻ。扫描电镜结果显示,纳米颗粒在衬底上随机分布,由于小颗粒存在较大的自由能特征,纳米颗粒呈团聚状。随着掺杂浓度的增加,沉积材料的光学带隙从2.0 eV增大到2.3 eV。
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Electrochemical deposition of tin doped zinc selenide (SnZnSe) thin film material
In this research study, the growth of SnZnSe thin film materials was carried out using the cationic precursor, which was an aqueous solution of 0.035 mol solution of ZnSO4.7H2O while the anionic precursor was 0.1 mol solution of selenium metal powder was prepared by dissolving with 4 mL of hydrogen chloride (HCl). The XRD of the films deposited on FTO substrates at different dopant concentration 1%, 2%, 3% and 4% showed the reflection peaks at (220), (221), (300), (310), (311), (222) and (320) with the lattice constant of a=7.189 Ǻ.  The SEM results revealed the random distribution of tiny nano-grains on the substrate, the nano-grains were observed to agglomerate due to the presence of large free energy characteristics of small particles. The optical bandgap of the deposited material enhanced from 2.0-2.3 eV as the dopant concentration increased.
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