{"title":"聚四氟乙烯传导电流的影响因素","authors":"G. Raju, M. A. Sussi","doi":"10.1109/ICSD.1998.709272","DOIUrl":null,"url":null,"abstract":"Conduction currents in Teflon (PolyTetraFluoroEthylene, PTFE) films having thickness of 50 /spl mu/m and 130 /spl mu/m are measured over a temperature range of 40-200/spl deg/C and electric field strengths up to 246 kV cm/sup -1/. The importance of space charge effects in both ionic and electronic conduction at different temperature ranges are discussed.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"4 1","pages":"249-252"},"PeriodicalIF":0.0000,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Factors influencing conduction currents in Teflon\",\"authors\":\"G. Raju, M. A. Sussi\",\"doi\":\"10.1109/ICSD.1998.709272\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Conduction currents in Teflon (PolyTetraFluoroEthylene, PTFE) films having thickness of 50 /spl mu/m and 130 /spl mu/m are measured over a temperature range of 40-200/spl deg/C and electric field strengths up to 246 kV cm/sup -1/. The importance of space charge effects in both ionic and electronic conduction at different temperature ranges are discussed.\",\"PeriodicalId\":13148,\"journal\":{\"name\":\"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)\",\"volume\":\"4 1\",\"pages\":\"249-252\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-06-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICSD.1998.709272\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSD.1998.709272","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Conduction currents in Teflon (PolyTetraFluoroEthylene, PTFE) films having thickness of 50 /spl mu/m and 130 /spl mu/m are measured over a temperature range of 40-200/spl deg/C and electric field strengths up to 246 kV cm/sup -1/. The importance of space charge effects in both ionic and electronic conduction at different temperature ranges are discussed.