{"title":"一种用于互连测试的线性最优测试生成算法","authors":"C. Su","doi":"10.1145/288548.288626","DOIUrl":null,"url":null,"abstract":"A linear optimal test generation algorithm is proposed to decompose serial test vectors into segments with one for each driver. Each driver is assigned a serial vector with two or more transitions for the detection of net and driver faults. As compared to the conventional counting and transition sequences, the reduction is up to 20% for buses and 36% for general networks.","PeriodicalId":90518,"journal":{"name":"ICCAD. IEEE/ACM International Conference on Computer-Aided Design","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1998-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A linear optimal test generation algorithm for interconnect testing\",\"authors\":\"C. Su\",\"doi\":\"10.1145/288548.288626\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A linear optimal test generation algorithm is proposed to decompose serial test vectors into segments with one for each driver. Each driver is assigned a serial vector with two or more transitions for the detection of net and driver faults. As compared to the conventional counting and transition sequences, the reduction is up to 20% for buses and 36% for general networks.\",\"PeriodicalId\":90518,\"journal\":{\"name\":\"ICCAD. IEEE/ACM International Conference on Computer-Aided Design\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ICCAD. IEEE/ACM International Conference on Computer-Aided Design\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/288548.288626\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ICCAD. IEEE/ACM International Conference on Computer-Aided Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/288548.288626","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A linear optimal test generation algorithm for interconnect testing
A linear optimal test generation algorithm is proposed to decompose serial test vectors into segments with one for each driver. Each driver is assigned a serial vector with two or more transitions for the detection of net and driver faults. As compared to the conventional counting and transition sequences, the reduction is up to 20% for buses and 36% for general networks.
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