捕捉过去的经验:专家扫描可视化映射过程

S. Ford, MichÁ le J. Routley, R. Phaal, D. Probert
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引用次数: 6

摘要

本文描述并反映了专家扫描的发展和应用,这是一种半结构化的视觉映射过程,可用于记录基于访谈的工业、组织和技术变革的历史记录。该过程已应用和完善,通过13采访经验丰富的专业人士在商业喷墨在英国。研究发现,与非视觉访谈相比,它具有显著的优势,包括提高受访者的参与度和提供实时评估的机会。访谈后,专家扫描获得的数据可以与其他扫描合成,或用作面向未来的道路测绘活动的输入。
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Capturing past experience: the Expert Scan visual mapping process
This paper describes and reflects on the development and application of the Expert Scan, a semi–structured visual mapping process, which can be used to record historical interview–based accounts of industrial, organisational and technological change. The process has been applied and refined through 13 interviews with experienced professionals in commercial inkjet in the UK. It has been found to offer significant advantages over the non–visual interview, including improving interviewee engagement and providing opportunities for real–time evaluation. Post–interview, data obtained from the Expert Scan can be synthesised with other scans or used as an input to future–oriented roadmapping activities.
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来源期刊
International Journal of Technology Intelligence and Planning
International Journal of Technology Intelligence and Planning Business, Management and Accounting-Management of Technology and Innovation
CiteScore
3.20
自引率
0.00%
发文量
2
期刊介绍: The IJTIP is a refereed journal that provides an authoritative source of information in the field of technology intelligence, technology planning, R&D resource allocation, technology controlling, technology decision-making processes and related disciplines.
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