自组装镍纳米掩膜等离子体刻蚀制备和修复GaN纳米棒

IF 0.9 4区 物理与天体物理 Q4 PHYSICS, APPLIED European Physical Journal-applied Physics Pub Date : 2021-03-01 DOI:10.1051/EPJAP/2021210002
Shiying Zhang, Lei Zhang, Yueyao Zhong, Guodong Wang, Qingjun Xu
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引用次数: 1

摘要

采用电感耦合等离子体(ICP)刻蚀法在GaN薄膜上制备了高晶体质量的氮化镓纳米棒阵列,并进行了氨退火和KOH刻蚀修复工艺。通过快速热退火形成镍纳米岛,其密度、形状和尺寸受退火温度和镍层厚度的调节。采用高分辨率x射线衍射(HRXRD)、拉曼光谱(Raman spectroscopy)和光致发光(PL)技术对GaN外延层纳米棒的结构和光学性能进行了比较研究。结果表明,等离子体损伤可通过900℃NH3退火成功愈合。在KOH溶液中进行湿处理后,可以有效地减小蚀刻纳米棒的平均直径,消除等离子体蚀刻损伤。结果发现,随着KOH刻蚀时间的增加,GaN纳米棒的直径不断减小,PL强度先增大后减小,最后增大。
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Fabrication and repair of GaN nanorods by plasma etching with self-assembled nickel nanomasks
High crystal quality GaN nanorod arrays were fabricated by inductively coupled plasma (ICP) etching using self-organized nickel (Ni) nano-islands mask on GaN film and subsequent repaired process including annealing in ammonia and KOH etching. The Ni nano-islands have been formed by rapid thermal annealing, whose density, shape, and dimensions were regulated by annealing temperature and Ni layer thickness. The structural and optical properties of the nanorods obtained from GaN epitaxial layers were comparatively studied by high-resolution X-ray diffraction (HRXRD), Raman spectroscopy and photoluminescence (PL). The results indicate that damage induced by plasma can be successfully healed by annealing in NH3 at 900 °C. The average diameter of the as-etched nanorod was effectively reduced and the plasma etch damage was removed after a wet treatment process in a KOH solution. It was found that the diameter of the GaN nanorod was continuously reduced and the PL intensity first increased, then reduced and finally increased as the KOH etching time sequentially increased.
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来源期刊
CiteScore
1.90
自引率
10.00%
发文量
84
审稿时长
1.9 months
期刊介绍: EPJ AP an international journal devoted to the promotion of the recent progresses in all fields of applied physics. The articles published in EPJ AP span the whole spectrum of applied physics research.
期刊最新文献
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